KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
Abstract: To overcome the drawbacks of manual defect detection and the challenges of traditional visual inspection algorithms, such as high missed detection rates, slow detection speeds, and ...
"What started as something asymptomatic for the majority of my life turned into a lingering cough, which turned to chest pains, bouts of coughing up blood, then at times, struggling to breathe," she ...
Abstract: Artificial images for defect detection have gained growing importance in the recently developed defect detection architectures. This systematic literature review examines the use of ...
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