Modern integrated circuits are made by depositing layers of different materials upon substrates and then etching circuits within those films. The thickness of the films must be precisely controlled in ...

The measurement of film thickness holds significance for various manufacturing and research facilities. Fluctuations in the thickness of paint or coating can impact multiple properties crucial to the ...

The QDI 2010 Film(TM) is a specialised instrument developed from the existing QDI 2010 UV-VIS-NIR microspectrophotometer – the first ever to combine both UV microscopy and microspectroscopy in a ...

Coatings and thin films are applied to the surface of materials to alter their properties. Being able to measure the thickness and uniformity of these thin films is important as variations can effect ...

In the dynamic landscape of Report Ocean, a groundbreaking research study titled “Asia Pacific Film Thickness Measurement Market” has been released for the year 2024. Developed to provide a holistic ...

Researchers at the University of Illinois, US, have developed an automated optical film-thickness measurement technique that they claim is both inexpensive and non-intrusive. Precise measurements of ...

CRAIC Technologies has introduced CRAIC FilmPro™ film thickness measurement software. This software package is designed to plug-in to CRAIC Technology’s microspectrophotometers and their controlling ...

Thin film thickness measurement on flat panel displays, MEMS and other semicon devices is a common requirement, so Elliot Scientific is now offering the new QDI 2010 Film microspectrophotometer. The ...